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Scientific Program

  • All activities in the scientific program will take place at University of Naples Federico II Conference Center - Via Partenope 36 (view Google Map)
  • Talks (besides some exceptions) will be scheduled in 30-minute slots, consisting of approximately 20–22 minutes for the presentation and 8–10 minutes for audience questions and speaker transitions.
  • Presentations (in PDF or PowerPoint format) should be uploaded in the conference room during breaks or when no sessions are in progress. Alternatively, presenters may submit their presentation(s) — in PDF or PowerPoint format and no larger than 25 MB — as an email attachment to This email address is being protected from spambots. You need JavaScript enabled to view it. by July 5th. The conference room will be equipped with a Windows laptop. To ensure smooth transitions between talks, we kindly ask all presenters to:
    • Be in the conference room at least 10 minutes before the session starts
    • Meet the session chair
    • Transfer their presentation to the laptop provided
    • Test compatibility and become familiar with the technical equipment

08:30-18:00

Registration

09:30-00:00

Opening Ceremony

  • D. Accardo, Director of CESMA (Advanced Center for Metrological Services)
  • N. Bianco, Director of the Department of Industrial Engineering
  • A. Lanzotti, MICS South delegate
  • Representative of the Scientific Committee
  • Chairs of the Local Organizing Committee (LOC)

10:00–10:45

Session #1: Ross Spark's Memory and Honor
Chair: Subhabrata Chakraborti

  • Kwok Tsui, UT Arlington, USA (recording)
  • Eugenio Epprecht, PUC-Rio, Brazil (recording)
  • Sotiris Bersimis, University of Piraeus, Greece (recording)
  • Reminiscences from the audience

10:45

Coffee Break

11:15–12:30

Session #2 Developments in Statistical Process Monitoring with Interval and Exponential Data
Chair: Subhabrata Chakraborti

  • 11:15 Statistical Process Monitoring with Interval Data W. Woodall, S. Steiner
  • 11:45 EWMA control charts for exponential data — workbench for considering transformations and numerical methods S. Knoth

12:30

Group Photo and LOC Organizational Notes

13:00

Lunch Break

14:30-16:00

Panel Discussion: Current Status and Future of SPM
Moderator: Subhabrata Chakraborti

  • Sven Knoth (Helmut Schmidt University, Germany)
  • Kamran Paynabar (Georgia Tech, USA)
  • Fugee Tsung (Hong Kong University of Science and Technology, HONG KONG)
  • William Woodall (Virginia Tech, USA)

16:00

Coffee Break

16:30-18:00

Session #3: Adaptive Strategies for Modern Process Monitoring
Chair: Sven Knoth

  • 16:30 Active Learning in Process Monitoring Using Streaming Data C. Capezza, A. Lepore, K. Paynabar
  • 17:00 Adapting OpenAI’s CLIP Model for Few-Shot Image Inspection in Manufacturing Quality Control: An Expository Case Study with Multiple Application Examples F. M. Megahed, Y. Chen, B. M. Colosimo, M. L. Grasso, L. Jones-Farmer, S. Knoth, H. Sun, I. Zwetsloot
  • 17:30 An Adaptive Multivariate Functional Control Chart F. Centofanti,  A. Lepore, B. Palumbo

18:00

LOC Organizational Notes

09:00-17:40

Registration

09:30-11:00

Session #4: Nonparametric, Bayesian and Modified SPM Schemes
Chair: Giovanni Celano

  • 09:30 Nonparametric Control Charts for Detecting Shifts in Location and Scale based on new Lepage-type Statistics A. Rakitzis, S. R. Shinde, S. B. Mahadik, D. G. Godase
  • 10:00 Self-Starting Shiryaev (3S): A Bayesian Change Point Model for Online Monitoring of Short Runs P. Tsiamyrtzis, K. Bourazas 
  • 10:30 Practical Significance and the Modified Control Chart with Estimated Parameters F. Schoemer Jardim, B. Ker Simão, P. C. Oprime, S. Chakraborti, M. A. Guerreiro Machado

11:00

Coffee Break

11:30–13:00

Session #5: Advances in Process Monitoring for Discrete and Capability Metrics
Chair: Athanasios Rakitzis

  • 11:30 The expressions to obtain the probability with which the sample Cpk values exceed a threshold A. F. Costa
  • 12:00 Design of EWMA control charts for monitoring the zero-inflated negative binomial distribution using conditional false alarm rate B. Aytaçoğlu
  • 12:30 Preliminary results on new control charts for inflated binomial processes (part I) A. Arques-Colomina, M. C. Belmonte-Bueso, V. Giner-Bosch, P. Castagliola

13:00

LOC Organizational Notes

13:15

Lunch Break

15:00-16:30

Session #6 Young Session
Chair: William Woodall

  • 15:00 Preliminary results on new control charts for inflated binomial processes (part II) A. Arques-Colomina, M. C. Belmonte-Bueso, V. Giner-Bosch, P. Castagliola 
  • 15:30 Old Tool, New Purpose: Statistically Equivalent Blocks in Multivariate SPC C. L. Holcombe 
  • 16:00 Detecting Covariance Shifts in Multichannel Profiles C. Capezza, D. Forcina, A. Lepore, B. Palumbo

16:30

Coffee Break

17:00-17:40

Session #7 Industrial Sponsors
Chair: Biagio Palumbo

  • 17:00 Hitachi Rail STS
  • 17:20 Grimaldi Group

17:40

LOC Organizational Notes

09:00-11:30

Registration

09:30-11:00

Session #8: Functional and Multivariate SPM in Modern Applications
Chair: Christian Capezza

  • 09:30 Efficient Monitoring of Highly Dimensional Data Streams S. Bersimis, K. Skarlatos, P. Economou
  • 10:00 Long-term profile monitoring with multivariate functional data for application in structural health monitoring P. Wittenberg, A. Mendler, S. Knoth, J. Gertheiss
  • 10:30 From classical SQC to Quality 5.0 with qcr package S. Naya, J. Tarrío-Saavedra, R. Fernández-Casal, M. Flores

11:00

Coffee Break

11:30–13:00

Session #9: Machine Learning for Process Monitoring: Methods, Challenges, and Applications
Chair: Sotiris Bersimis

  • 11:30 One-Class Classification in Neural Networks E. Maboudou, P. Senaratne
  • 12:00 Practical Considerations for Implementing the Isolation Forest EWMA Control Chart in Phase II Process Monitoring T. Perdikis, G. Celano, S. Chakraborti
  • 12:30 Image-Based Process Control: A CNN Approach for Joint Detection and Localization in Spatiotemporal Fault Analysis H. Sabahno

13:00

LOC Organizational Notes

13:15

Lunch Break

15:00-16:00

Session #10 Young Session
Chair: Antonio Lepore

  • 15:00 Online Monitoring of Unstructured Varying-size Point Cloud Data: A Registration-free Approach M. Patalano, G. Capizzi, K. Paynabar
  • 15:30 Calibration of a joint monitoring scheme with cautious parameter learning for guaranteed in-control performance A. Wendler, M. Beruvides, V. G. Tercero Gómez

16:00

Coffee Break

16:30-17:00

Closing Remarks

  • Recognize to present and past Local Organizers
  • Next ISSPM 2027 location

17:00

LOC Organizational Notes

8:30-18:00
Registration

9:30
Opening Ceremony

  • D. Accardo, Director of CESMA (Advanced Center for Metrological Services)
  • N. Bianco, Director of the Department of Industrial Engineering
  • A. Lanzotti, MICS South delegate
  • Representative of the Scientific Committee
  • Chairs of the Local Organizing Committee (LOC)

10:00-10:45
Session #1: Ross Spark's Memory and Honor
Chair: Subhabrata Chakraborti

  • Kwok Tsui, UT Arlington, USA (video)
  • Eugenio Epprecht, PUC-Rio, Brazil (video)
  • Sotiris Bersimis, University of Piraeus, Greece (video)
  • Reminiscences from the audience

10:45
Coffee Break

11:15-12.30
Session #2 Developments in Statistical Process Monitoring with Interval and Exponential Data
Chair: Subhabrata Chakraborti

  • 11:15 Statistical Process Monitoring with Interval Data W. Woodall, S. Steiner
  • 11:45 EWMA control charts for exponential data — workbench for considering transformations and numerical methods S. Knoth 

12:30
Group Photo and LOC Organizational Notes

13:00
Lunch Break

14:30-16:00
Panel Discussion: Current Status and Future of SPM
Moderator: Subhabrata Chakraborti

  • Sven Knoth (Helmut Schmidt University, Germany)
  • Kamran Paynabar (Georgia Tech, USA)
  • Fugee Tsung (Hong Kong University of Science and Technology, HONG KONG)
  • William Woodall (Virginia Tech, USA)

16:00
Coffee Break

16:30-18:00
Session #3: Adaptive Strategies for Modern Process Monitoring

Chair: Sven Knoth

  • 16:30 Active Learning in Process Monitoring Using Streaming Data C. Capezza, A. Lepore, K. Paynabar
  • 17:00 Adapting OpenAI’s CLIP Model for Few-Shot Image Inspection in Manufacturing Quality Control: An Expository Case Study with Multiple Application Examples F. M. Megahed, Y. Chen, B. M. Colosimo, M. L. Grasso, L. Jones-Farmer, S. Knoth, H. Sun, I. Zwetsloot
  • 17:30 An Adaptive Multivariate Functional Control Chart F. Centofanti,  A. Lepore, B. Palumbo

18:00
LOC Organizational Notes

9:30-17:40
Registration

09:30-11:00
Session #4: Nonparametric, Bayesian and Modified SPM Schemes

Chair: Giovanni Celano

  • 09:30 Nonparametric Control Charts for Detecting Shifts in Location and Scale based on new Lepage-type Statistics A. Rakitzis, S. R. Shinde, S. B. Mahadik, D. G. Godase
  • 10:00 Self-Starting Shiryaev (3S): A Bayesian Change Point Model for Online Monitoring of Short Runs P. Tsiamyrtzis, K. Bourazas 
  • 10:30 Practical Significance and the Modified Control Chart with Estimated Parameters F. Schoemer Jardim, B. Ker Simão, P. C. Oprime, S. Chakraborti, M. A. Guerreiro Machado

11:00
Coffee Break

11:30-13:00
Session #5: Advances in Process Monitoring for Discrete and Capability Metrics

Chair: Athanasios Rakitzis

  • 11:30 The expressions to obtain the probability with which the sample Cpk values exceed a threshold A. F. Costa
  • 12:00 Design of EWMA control charts for monitoring the zero-inflated negative binomial distribution using conditional false alarm rate B. Aytaçoğlu
  • 12:30 Preliminary results on new control charts for inflated binomial processes (part I) A. Arques-Colomina, M. C. Belmonte-Bueso, V. Giner-Bosch, P. Castagliola

13:00
LOC Organizational Notes

13:15
Lunch Break

15:00-16:00
Session #6 Young Session

Chair: Giovanna Capizzi

  • 15:00 Preliminary results on new control charts for inflated binomial processes (part II) A. Arques-Colomina, M. C. Belmonte-Bueso, V. Giner-Bosch, P. Castagliola 
  • 15:30 Old Tool, New Purpose: Statistically Equivalent Blocks in Multivariate SPC C. L. Holcombe 
  • 16:00 Detecting Covariance Shifts in Multichannel Profiles C. Capezza, D. Forcina, A. Lepore, B. Palumbo

16:30
Coffee Break

17:00-17:40
Session #7 Industrial Sponsors
Chair: Biagio Palumbo

  • 17:00 Hitachi Rail STS
  • 17:20 Grimaldi Group

17:40
LOC Organizational Notes

9:00-11:30
Registration

9:30-11:00
Session #8: Functional and Multivariate SPM in Modern Applications

Chair: Christian Capezza

  • 09:30 Efficient Monitoring of Highly Dimensional Data Streams S. Bersimis, K. Skarlatos, P. Economou
  • 10:00 Long-term profile monitoring with multivariate functional data for application in structural health monitoring P. Wittenberg, A. Mendler, S. Knoth, J. Gertheiss
  • 10:30 From classical SQC to Quality 5.0 with qcr package S. Naya, J. Tarrío-Saavedra, R. Fernández-Casal, M. Flores

11:00
Coffee Break

11:30-13:00
Session #9: Machine Learning for Process Monitoring: Methods, Challenges, and Applications

Chair: Sotiris Bersimis

  • 11:30 One-Class Classification in Neural Networks E. Maboudou, P. Senaratne
  • 12:00 Practical Considerations for Implementing the Isolation Forest EWMA Control Chart in Phase II Process Monitoring T. Perdikis, G. Celano, S. Chakraborti
  • 12:30 Image-Based Process Control: A CNN Approach for Joint Detection and Localization in Spatiotemporal Fault Analysis H. Sabahno

13:00
LOC Organizational Notes

13:15
Lunch Break

15:00-16:00
Session #10 Young Session

Chair: Antonio Lepore

  • 15:00 Online Monitoring of Unstructured Varying-size Point Cloud Data: A Registration-free Approach M. Patalano, G. Capizzi, K. Paynabar
  • 15:30 Calibration of a joint monitoring scheme with cautious parameter learning for guaranteed in-control performance A. Wendler, M. Beruvides, V. G. Tercero Gómez

16:00
Coffee Break

16:30-17:00
Closing Remarks

  • Recognize to present and past Local Organizers
  • Next ISSPM 2027 location

17:00
LOC Organizational Notes